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The partners in the research project "RESIST" have spent the last three years working on new approaches to the development of resilient electronic systems. Their results contribute to the next generation of especially fail-safe vehicle electronics to meet the highest quality, safety and performance standards.

Over the last two years, Fraunhofer IIS/EAS and the semiconductor manufacturer GLOBALFOUNDRIES have worked together in the project »MARS« to advance the development of highly reliable 22 nm FDSOI components. These components should pave the way for »tactile intelligent systems« made in Dresden.

Fraunhofer IIS/EAS is offering advanced modeling services for device degradation effects in North America. Using these proprietary techniques, designers are now able to verify the long-term behavior of integrated circuits (ICs) and systems especially in safety critical applications. Compared to today’s solutions, the advanced models can be used in all common industrial design environments. In addition to standard degradation effects, Fraunhofer also takes into account more complex dependencies and recovery effects.